As part of its xiLAB initiative, XIMEA expands the xiJ family of cooled sCMOS cameras with models for XUV and Soft X-ray imaging.

As part of its xiLAB initiative, XIMEA expands the xiJ family of cooled sCMOS cameras with models for XUV and Soft X-ray imaging.

For a long time, the diffraction limit defined by Ernst Abbe defined the natural barrier that restricts the resolution of small objects.

To overcome this limitation multiple techniques like STED, STORM, PALM, TEM or others were developed, using advanced illumination and detection technologies.

In its original sense, the Abbe limit states, that the shorter the wavelength of the particle, the higher the resolution.

Therefore the observability to resolve small structural features in the image is also higher.

This fundamental law applies to visible light and to all photons of the electromagnetic spectrum.

That includes the high energy containing photons of extreme UV (XUV), roentgen radiation (Xray), and electrons.

While the diffraction limit is still valid, using XUV (CWL: 13.5nm), soft-Xray, and high energy containing electrons, it is possible to push the resolution higher.

Thus, enabling to resolve the fine structural features and dynamics in biological processes (cells, human body) as well as materials. XIMEA's solutionTo fulfill these needs and leverage the high potential of XUV/soft-Xray, XIMEA added a new MJ042MR-GP-P11-BSI-UV model to the scientific portfolio of cameras.

The model is equipped with the new Gpixel GSENSE400BSI-UV (PulSar) sCMOS sensor that is combined with Peltier cooling and USB3 interface.

The camera body is extended by a standard DN 63 CF vacuum flange. Additional flange formats are available upon demand.

By using the new Pulsar sensor the spectral range is extended from IR, VIS, and UV into the soft-Xray regime, covering a maximum range from 0,5 to 1000 nm.IMAGE: MJ042MR-GP-P11-BSI-UV camera model explode

The main specifications of the new MJ042 Pulsar models are:

MJ042MR-GP-P11-BSI-UV: 4.2 Mpix, Gpixel GSENSE400 BSI, backside illuminated monochrome, 2048 x 2048, 11 μm pixel, 2" with TEC and USB3
MJ042MR-GP-P6-BSI-UV: 4.2 Mpix, Gpixel GSENSE2020 BSI, backside illuminated monochrome, 2048 x 2048, 6.5 μm pixel, 1.2" with TEC and USB3
Wavelength sensitivity ranges:
Soft X-ray: 0.2 - 12 nm (0.1 - 5KeV)
XUV, EUV: 10 - 124 nm (<0.1Kev @ cw:13.5nm)
IMAGE: Quantum efficiency graph for the GSENSE 400 BSI Pulsar sensor
Advantages:
Unique selling proposition:
Overall benefits:
Fast image acquisition and high framerates - 48 Fps
Compact
Simple USB interface
Peltier cooling - Exceptional temperature stability (indium gaskets etc.)
Custom sensor timings
Modified sensor chamber, no outgassing, protected electronics
Overall benefits:
High Quantum efficiency up to 99%
Dynamic range in HDR mode of above 95 dB
Low noise around 1.7 e-
High Full Well Capacity - up to 128K e-
Improved axial-lateral resolution
Vacuum compatibility (exposed sensor)
Applications
The wide pool of possible applications for this kind of detector ranges from Astronomy to nanotechnology throughout industrial and life science applications.

The industry demands new technologies to shrink the size of electronic components and increase their quality through coherent diffraction imaging techniques.

Science on the other hand requires this radiation to overcome the diffraction limit and resolve even smaller structural features. For both, XIMEA developed a new camera operating with high sensitivity in Soft Xray spectroscopy and tomography.

Moreover, many chemical gases, as well as biological relevant molecules, have spectral signatures in the soft-Xray and UV regime.

Thus, these cameras are well suited to visualize and quantify mesoscale biology in the plane and 3D-image reconstruction and other applications like:
XANES
X-ray absorption near edge structure spectroscopy
Hyperspectral
Soft X-ray Water Window Tomography
X-PEEM
X-ray photoemission electron microscopy
Forensic
Atmospheric chemistry/ composition
STXM
Scanning transmission x-ray microscopy
Solar imaging
XUV ptychography and spectrometry
EUV lithography
Semiconductor metrology
Correlative microscopy
Electron detection imaging
NEXAFS
Near Edge X-ray Absorption fine structure
Additive manufacturing
Phase contrast imaging
UVRR
UV Resonance Raman spectroscopy
FIB/SEM: 3D imaging
About XIMEA
For more than 20 years XIMEA has developed, manufactured, and sold standard and OEM cameras for machine vision applications in motion control, assembly, robotics, industrial inspection and security, as well as scientific grade cameras for life science and microscopy. The main distinction is based on the flexibility of development and production processes and the extremely robust way the cameras are built while still providing highest speed and power. Drawing on more than two decades of experience in the industry, XIMEA offer consists of state-of-the-art cameras with FireWire, USB 2.0, USB 3.0, and smart cameras with embedded PC and GigE interface.

Learn more about XIMEA at http://www.ximea.com